Channel write/erase flash memory cell and its manufacturing method

ABSTRACT

A pseudo-dynamic operating method and a flash memory cell capable of performing this operating method are disclosed. A parasitic capacitor near the drain terminal of the flash memory can be charged in few microseconds during operation. Interference generated between the floating gate and the source is avoided by using a first oxide layer which is thicker at the interface between floating gate and source and thinner near central part under stacked gate.

CROSS REFERENCE TO RELATED APPLICATIONS

[0001] This application is a division of application Ser. No. 09/683,580filed on Jan. 22, 2002.

BACKGROUND OF INVENTION

[0002] 1. Field of the Invention

[0003] The present invention relates to a nonvolatile memory cell, andmore particularly, to a channel write/erase flash memory cell and itsoperation method.

[0004] 2.Description of the Related Art

[0005] Please refer to FIG. 1. FIG. 1 is a cross-sectional view of aconventional flash memory cell 10. It includes a substrate 11, a firstfield oxide layer 12, a stacked gate 14, an N-type doping region 16, ashallow P-type doping region 18, a deep P-type doping region 20, and asource region 22.

[0006] The stacked gate 14 includes a control gate 13 and a floatinggate 15 under the control gate 13. The N-type doping region 16 is formedbetween the first field oxide layer 12 and the stacked gate 14. Theshallow P-type doping region 18 is formed next to the N-type dopingregion 16 and under the stacked gate 14. The deep P-type doping region20 and the shallow P-type region 18 are doped with the same type ofdopants. The deep P-type doping region 20 is formed under the N-typedoping region 16 and is in contact with the first field oxide layer 12and also the shallow P-type doping region 18. The deep P-type dopingregion 20 functions as a P well and its well depth is much deeper thanthe well depth of the shallow P-type doping region 18. The deep P-typedoping region 20 and the N-type doping region 16 are electricallyconnected which functions as a drain terminal of the flash memory cell10. The source region 22, functioning as a source terminal of the flashmemory cell 10, is formed next to the shallow P-type region 18.Additionally, under the source region 22 a lightly doped region 24 isformed which is doped with the same type of dopants like the sourceregion 22 but with a lighter density.

[0007] The programming method of the flash memory cell 10 will beexplained below. When programming the flash memory cell 10, a word linevoltage V_(WL)=−10V is applied to the control gate 13, a bit linevoltage V_(BL)=5V is applied to the drain terminal, i.e. the shortedN-type doping region 16 and the deep P-type doping region 20, and novoltage is applied to the source terminal 22 so as to make it floating.Under this programming condition, electrons will eject from the floatinggate 15 to the drain terminal due to the edge Fowler-Nordheim effectthereby achieving the effect of programming the flash memory cell 10.

[0008] However, in the above conventional programming method, a seriesof flash memory cells are programmed in a cell-by-cell sequence. Asshown in FIG. 2, two flash memory cells 30 and 32 arranged in parallelare shown. Typically, it takes about 4 ms to complete the programming ofone flash memory cell when a bit line voltage V_(BL)=5V is applied tothe flash memory cells 30 and 32. If 10 parallel flash memory cells areto be programmed, it will take 40 ms (10*4 ms) to complete theprogramming job. It means a great deal of time is needed when using theconventional programming method. Consequently, there is a need toprovide a more effective flash memory structure and programming method.

SUMMARY OF INVENTION

[0009] Accordingly, it is the primary objective of the present inventionto provide a new channel write/erase flash memory cell structure andalso a new programming method.

[0010] In another aspect, the present invention provides a programmingmethod in which a parasitic capacitor is used to temporally store bitline data to significantly increase the programming speed.

[0011] In one further aspect, the present invention provides a method offorming the aforementioned channel write/erase flash memory cellstructure.

[0012] To achieve these and other advantages and in accordance with thepurpose of the claimed invention, as embodied and broadly describedherein, the present invention provides a channel write/erase flashmemory cell structure capable of providing a pseudo-dynamic programmingmethod. The structure includes a substrate of first conductivity type, adeep ion well of second conductivity type, an ion well of firstconductivity type, a first oxide layer, a stacked gate, a doping regionof first conductivity type, a shallow doping region of secondconductivity type, and a deep doping region of second conductivity type.

[0013] The deep ion well of second conductivity type is formed in thesubstrate. The ion well of first conductivity type is positioned abovethe deep ion well of second conductivity type to create a parasiticcapacitor during programming. The first oxide layer is formed on thesubstrate above the ion well of first conductivity type. The stackedgate is formed next to the first oxide layer and over the ion well offirst conductivity type. The doping region of first conductivity type ispositioned under the first oxide layer and on one side of the stackedgate to function as a drain. The shallow doping region of secondconductivity type is formed next to the doping region of firstconductivity type and under the stacked gate. The deep doping region ofsecond conductivity type is positioned under the doping region of firstconductivity type and is in contact with the shallow doping region ofsecond conductivity type.

[0014] In the preferred embodiment of the present invention, the firstconductivity type is N type and the second conductivity type is P type.The first oxide layer extends into the stacked gate with a decreasingoxide thickness for reducing interference during operation.

[0015] Further, a source doping region is formed next to the shallowdoping region of second conductivity type and under the first oxidelayer to function as a source terminal. The doping region of firstconductivity type and the source doping region are doped with VAelements such as phosphorus. The shallow doping region of secondconductivity type and the deep doping region of second conductivity typeare both doped with IIIA elements such as boron.

[0016] Furthermore, the doping region of first conductivity type and thedeep doping region of second conductivity type are short-circuitedtogether by using, for example, a metal contact penetrating through thedoping region of first conductivity type to the deep doping region ofsecond conductivity type, or, alternatively, by using a metal contactformed across exposed doping region of first conductivity type and thedeep doping region of second conductivity type.

[0017] Additionally, the present invention provides a method of forminga channel write/erase flash memory cell capable of performing apseudo-dynamic programming method. The structure is formed by providinga substrate of first conductivity type, and then forming a deep ion wellin the substrate. Next, an ion well of first conductivity type is formedin the deep ion well of second conductivity type. A first oxide layer isthen formed over the ion well of first conductivity type. A stacked gateis formed later partially over the first oxide layer. A doping region offirst conductivity type acting as a drain is formed under the firstoxide layer and next to the stacked gate. A shallow doping region ofsecond conductivity type is formed next to the doping region of firstconductivity type and under the stacked gate. A deep doping region ofsecond conductivity type is formed under the doping region of firstconductivity type and is in contact with the shallow doping region ofsecond conductivity type.

[0018] The method according to the present invention further includes asource doping region acting as a source terminal formed next to theshallow doping region of second conductivity type and under the firstoxide layer. A metal contact is formed to short-circuit the dopingregion of first conductivity type and the deep doping region of secondconductivity type. Or, a metal contact can be formed across the exposeddoping region of first conductivity type and the deep doping region ofsecond conductivity type so that these two regions can beshort-circuited together. In one preferred embodiment according to thepresent invention, the substrate and the ion well of first conductivitytype are both doped with N type dopants, and the deep ion well of secondconductivity type is doped with P type dopants. To avoid interferenceduring operation, the first oxide layer has a thickness that is thinnerunder the central part of the stacked gate and is thicker at two sidesof the stacked gate.

[0019] Additionally, the present invention provides a pseudo-dynamicprogramming method for programming the channel write/erase flash memorycell. When programming, a word line voltage V_(WL), a source linevoltage V_(SL), and a bit line voltage V_(BL) are applied respectivelyto control gate, source terminal, and drain terminal of the flash memorycell. An N well, a deep P well and an N substrate are positioned inorder under the flash memory cell. A well voltage V_(P) is applied tothe deep P well. The N well and the deep P well constitute a parasiticcapacitor when programming the flash memory cell.

[0020] When performing an erase operation, the word line voltage V_(WL)is in a high voltage level, the source line voltage V_(SL) is in avoltage level relatively lower than the word line voltage V_(WL), andthe bit line voltage V_(BL) is floating. The well voltage V_(P) and thesource line voltage V_(SL) are the same. When performing a programmingoperation, the word line voltage V_(WL) is in a low voltage level, thebit line voltage V_(BL) is in a voltage level relatively higher than theword line voltage V_(WL), and the source line voltage V_(SL) isfloating. The well voltage V_(P) is in a voltage level higher than theword line voltage V_(WL) but lower than the bit line voltage V_(BL).

[0021] When performing a read operation, the word line voltage V_(WL) isin a high voltage level, the source line voltage V_(SL) is in a voltagelevel relatively lower than the word line voltage V_(WL), and the bitline voltage V_(BL) is in a voltage level relatively lower than thesource line voltage V_(SL). The well voltage V_(P) is in a voltage levellower than the source line voltage V_(SL).

[0022] It is to be understood that both the forgoing general descriptionand the following detailed description are exemplary, and are intendedto provide further explanation of the invention as claimed. Otheradvantages and features of the invention will be apparent from thefollowing description, drawings and claims.

BRIEF DESCRIPTION OF DRAWINGS

[0023]FIG. 1 is a cross-sectional view of a conventional flash memorycell.

[0024]FIG. 2 is a schematic diagram depicting a series of memory cells.

[0025]FIG. 3 is a cross-sectional view showing the structure of thechannel write/erase flash memory cell according to the presentinvention.

[0026]FIG. 4 is an equivalent circuit of the channel write/erase flashmemory cell shown in FIG. 3.

[0027]FIG. 5 is a circuit diagram showing the pseudo-dynamic operationof the channel write/erase flash memory cell according to the presentinvention.

DETAILED DESCRIPTION

[0028] Please refer to FIGS. 3 and 4. FIG. 3 is a cross-sectional viewshowing the structure of the channel write/erase flash memory cell 40and FIG. 4 shows the equivalent circuit of the flash memory cell 40. Theflash memory cell 40 is built upon an N substrate 41 which comprises adeep P well 42 above the N substrate 41 and a N well 44 above the deep Pwell 42. The deep P well 42 and the N well 44 constitute a parasiticcapacitor 46 (shown in the equivalent circuit diagram) that facilitatesthe programming speed of the flash memory cell 40. The parasiticcapacitor 46 will be discussed in detail hereinafter.

[0029] A first oxide layer 48 is formed over the N well 44, and astacked gate 50 having a control gate 52 and a floating gate 54 isformed partially over the first oxide layer 48. An N doping region 56acting as a drain terminal is formed under the first oxide layer next tothe stacked gate 50. A shallow P doping region 60 is formed under thestacked gate 50 and next to the N doping region 56. A deep P dopingregion 62 is formed underneath the N doping region 56 and is contiguouswith the P doping region 60. An N doping region 64 acting as a source isformed under the first oxide layer 48 and next to the shallow P dopingregion 60.

[0030] To avoid undesired interference between the floating source andthe floating gate 54, the thickness of the first oxide layer 48 at theinterface between the N doping region 64 and the floating gate 54 isthicker than the thickness near the central part under the stacked gate50. That is, the first oxide layer 48 extends into the stacked gate 50with a decreasing thickness. Such a design can avoid electrons ejectionfrom the floating gate 54 to the high voltage source end. The N dopingregion 56 and the deep P doping region 62 are short-circuited together(marked in dash line 66) by a metal contact penetrating through the Ndoping region 56 to the deep P doping region 62. This prevents hot holesgenerated in the depletion region of the deep P doping region 62 frominjecting into the floating gate 54 in the presence of lateral electricfield. Alternatively, a metal contact may be formed across the exposed Ndoping region 56 and the deep P doping region 62 to short-circuit thesetwo regions.

[0031] In this preferred embodiment of the invention, the N dopingregions 56 and 64 are doped with VA elements such as phosphorus and theshallow P doping region 60 and the deep P doping region 62 are dopedwith IIIA elements such as boron.

[0032] Table 1 shows exemplary operating modes of the channelwrite/erase flash memory cell 40 of this invention. When operating theflash memory cell 40, a word line voltage V_(WL), a source line voltageV_(SL), and a bit line voltage V_(BL) are applied, respectively, to thecontrol gate 52, the source terminal 64, and the drain terminal 56 ofthe flash memory cell. As mentioned, N well 44, deep P well 42 and Nsubstrate 41 is positioned in order under the flash memory cell 40. Awell voltage V_(P) is applied to the deep P well 42. The N well 44 andthe deep P well 42 constitute a parasitic capacitor 46 when programmingthe flash memory cell. TABLE 1 V_(BL) V_(WL) selected nonselectedselected nonselected V_(SL) V_(P) program 5 V 0 V −10 V floatingfloating  0 V erase floating floating  10 V floating −8 V −8 V read 0 Vfloating  3.3 V floating  1 V  0 V

[0033] In table 1, when programs a selected memory cell, a low voltageV_(WL)=−10V is applied to the control gate of the selected memory cell,and the bit line voltage V_(BL) is higher than the word line voltageV_(WL), for example, V_(BL)=5V. The source remains in a floating state(V_(SL)=floating). A well voltage V_(P)=0V is applied to the deep P well42.

[0034] When erases the selected memory cell, the word line voltageV_(WL) (10V) is in a high voltage level, and the source line voltageV_(SL) (−8V) is in a voltage level relatively lower than the word linevoltage V_(WL), and the bit line voltage V_(BL) is floating. The wellvoltage V_(P) (−8V) and the source line voltage V_(SL) are the same.When read the selected memory cell, the word line voltage V_(WL) (3.3V)is in a high voltage level, the source line voltage V_(SL) (1V) is in avoltage level relatively lower than the word line voltage V_(WL), andthe bit line voltage V_(BL) (0V) is in a voltage level relatively lowerthan the source line voltage V_(SL). The well voltage V_(P) (0V) is in avoltage level lower than the source line voltage V_(SL). FIG. 5 is acircuit diagram showing the pseudo-dynamic operation of the channelwrite/erase flash memory cell according to the present invention. A bitline voltage V_(BL)=5V is controlled by a selecting transistor 70. Whenthe transistor 70 is turned on, the drain and the parasitic capacitor 74are charged to 5V in few microseconds (μs), typically less than 10 μs.The charged parasitic capacitor 74 is stand-by for subsequently ejectingelectrons 76 from the floating gate to the drain. Unlike theconventional programming method which takes about 4 ms to complete theprogramming of one flash memory cell, the pseudo-dynamic programoperation saves a great deal of time.

[0035] In summary, the present invention has the following advantageswhen comparing with the above-mentioned conventional flash memory.First, the parasitic capacitor near the drain terminal can be charged infew microseconds. Second, interference generated between the floatinggate and the source is avoided by using the first oxide layer which isthicker at the interface between floating gate and the source andthinner near the central part under the stacked gate. And third, hothole injection is also avoided since the N doping region and the deep Pdoping region are short-circuited together.

[0036] Those skilled in the art will readily observe that numerousmodification and alterations of the device may be made while retainingthe teachings of the invention. Accordingly, the above disclosure shouldbe construed as limited only by the metes and bounds of the appendedclaims.

What is claimed is:
 1. A pseudo-dynamic operating method for a channelwrite/erase flash memory cell, a word line voltage V_(WL), a source linevoltage V_(SL), and a bit line voltage V_(BL) being applied,respectively, to control gate, source terminal, and drain terminal ofthe flash memory cell, wherein an N well, a deep P well and an Nsubstrate are positioned in order under the flash memory cell, and awell voltage V_(P) is applied to the deep P well, and wherein the N welland the deep P well constitute a parasitic capacitor during programmingthe flash memory cell, the pseudo-dynamic operating method comprising:implementing an erase mode, wherein the word line voltage V_(WL) is in ahigh voltage level, the source line voltage V_(SL) is in a voltage levelrelatively lower than the word line voltage V_(WL), and the bit linevoltage V_(BL) is floating. The well voltage V_(P) and the source linevoltage V_(SL) are the same; implementing a program mode, wherein theword line voltage V_(WL) is in a low voltage level, the bit line voltageV_(BL) is in a voltage level relatively higher than the word linevoltage V_(WL), the source line voltage V_(SL) is floating, and the wellvoltage V p is in a voltage level higher than the word line voltageV_(WL) but lower than the bit line voltage V_(BL); and implementing aread mode, wherein the word line voltage V_(WL) is in a high voltagelevel, the source line voltage V_(SL) is in a voltage level relativelylower than the word line voltage V_(WL), and the bit line voltage V_(BL)is in a voltage level relatively lower than the source line voltageV_(SL). The well voltage V_(P) is in a voltage level lower than thesource line voltage V_(SL).
 2. The pseudo-dynamic operating method ofclaim 1 wherein voltage applied to the word line is between about 8 to10V, voltage applied to the source line is between about 12 to 8V, andvoltage applied to the deep P well is between about 12 to 8V whenimplementing the erase mode.
 3. The pseudo-dynamic operating method ofclaim 1 wherein voltage applied to the word line is between about −12 to−8V, voltage applied to the bit line is between about 3 to 7V, andvoltage applied to the deep P well is 0V when implementing the programmode.
 4. The pseudo-dynamic operating method of claim 1 wherein voltageapplied to the word line is between about 2 to 5V, voltage applied tothe bit line is between about −2 to 0V, voltage applied to the sourceline is between about 0 to 2V, and voltage applied to the deep P well is0V when implementing the read mode.